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https://ruomo.lib.uom.gr/handle/7000/139| Title: | A theoretical model for capturing the impact of design patterns on quality |
| Authors: | Charalampidou, Sofia Ampatzoglou, Apostolos Avgeriou, Paris Sencer, Seren Arvanitou, Elvira-Maria Stamelos, Ioannis |
| Subjects: | FRASCATI::Natural sciences::Computer and information sciences |
| Issue Date: | 2017 |
| First Page: | 1231 |
| Last Page: | 1238 |
| Volume Title: | Proceedings of the Symposium on Applied Computing |
| Part of Series: | SAC '17 |
| Part of Series: | SAC '17 |
| URI: | https://doi.org/10.1145/3019612.3019781 https://ruomo.lib.uom.gr/handle/7000/139 |
| ISBN: | 9781450344869 |
| Other Identifiers: | 10.1145/3019612.3019781 |
| Appears in Collections: | Department of Applied Informatics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| charalampidou2017sac.pdf | 494,25 kB | Adobe PDF | View/Open |
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