Please use this identifier to cite or link to this item: https://ruomo.lib.uom.gr/handle/7000/567
Title: Survivability Analysis Using Probabilistic Model Checking: A Study on Wireless Sensor Networks
Authors: Petridou, Sophia
Basagiannis, Stylianos
Roumeliotis, Manos
Type: Article
Subjects: FRASCATI::Natural sciences::Computer and information sciences
Keywords: Survivability
Wireless Sensor Networks
Probabilistic Model Checking
PRISM
Issue Date: Mar-2013
Publisher: IEEE
Source: IEEE Systems Journal
Volume: 7
Issue: 1
First Page: 4
Last Page: 12
Abstract: Survivability of a wireless sensor network (WSN) reflects the ability of the network to fulfill its mission despite the presence of abnormal events, such as failures. Given that sensor networks are receiving increasing attention due to the wide range of their applications, which include the critical areas of health, and military and security, survivability constitutes a key property for their study. This paper proposes a quantitative analysis for survivability evaluation of wireless sensors networks using probabilistic model checking. We define network survivability in line with four measures, namely, the frequency of failures, the data loss, the delay, and the compromised data due to a variety of failures. In particular, three types of failure events are considered, namely, node, link, and attack failures, which are due to power faults, communication faults, and black hole attacks, respectively. Then, we represent network's behavior with continuous-time Markov chains and randomly inject the aforementioned faults and attacks in the network to derive results that quantify the impact of them. Although the proposed study considers and provides results for a WSN architecture, it has the potential of being exploited in different networks with their own specifications.
URI: https://doi.org/10.1109/JSYST.2012.2224612
https://ruomo.lib.uom.gr/handle/7000/567
ISSN: 1932-8184
Electronic ISSN: 1937-9234
Other Identifiers: 10.1109/JSYST.2012.2224612
Appears in Collections:Department of Applied Informatics

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