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Please use this identifier to cite or link to this item: https://ruomo.lib.uom.gr/handle/7000/118
Title: Correlating Pattern Grime and Quality Attributes
Authors: Feitosa, Daniel
Ampatzoglou, Apostolos
Avgeriou, Paris
Nakagawa, Elisa Yumi
Subjects: FRASCATI::Natural sciences::Computer and information sciences
Issue Date: 2018
Source: IEEE Access
Volume: 6
First Page: 23065
Last Page: 23078
URI: https://doi.org/10.1109/ACCESS.2018.2829895
https://ruomo.lib.uom.gr/handle/7000/118
ISSN: 2169-3536
Other Identifiers: 10.1109/ACCESS.2018.2829895
Appears in Collections:Department of Applied Informatics

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