Please use this identifier to cite or link to this item: https://ruomo.lib.uom.gr/handle/7000/139
Title: A theoretical model for capturing the impact of design patterns on quality
Authors: Charalampidou, Sofia
Ampatzoglou, Apostolus
Avgeriou, Paris
Sencer, Seren
Arvanitou, Elvira-Maria
Stamelos, Ioannis
Subjects: FRASCATI::Natural sciences::Computer and information sciences
Issue Date: 2017
First Page: 1231
Last Page: 1238
Volume Title: Proceedings of the Symposium on Applied Computing
Part of Series: SAC '17
Part of Series: SAC '17
URI: https://doi.org/10.1145/3019612.3019781
https://ruomo.lib.uom.gr/handle/7000/139
ISBN: 9781450344869
Other Identifiers: 10.1145/3019612.3019781
Appears in Collections:Department of Applied Informatics

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